Metrology

Advances in the development of technologies and devices - semiconductors, optoelectronics, MEMS, nano-technology - require very powerful thin film and material characterization techniques. To this end, SUNY Poly has established a comprehensive characterization laboratory with several advanced analytical capabilities in support of its projects.

SUNY Poly's Nanoscale Metrology and Imaging Center offers its analytical capability and expertise to its Technology Development Partners that are hosted on campus. The Nanoscale Metrology and Imaging Center also provides its characterization expertise to third parties with the objective to assist local and regional colleges, universities and companies in their research and development efforts.

For more information and inquiries, contact Assistant VP Metrology Steve Novak, snovak@sunypoly.edu.                 

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