PR Web: Atomic Force Microscope Leader Park Systems Sponsors
Solid State Technology Magazine Webinar on Metrology Challenges and
Opportunities for Semiconductor Market
Published:
Monday, April 11, 2016 - 17:08
PR Web
Park Systems, world leader in atomic force microscopy (AFM) is sponsoring a webinar entitled Metrology Challenges and Opportunities presented by Solid State Technology Magazine on April 14, 2016 at 10am PST. The webinar will address advanced materials used in semiconductor silicon wafer manufacturing and new device structures and designs under various stages of development. The presenter for the webinar is industry expert and SPIE Fellow, Dr. Alain Diebold, whose career includes cutting edge research on advanced metrology methods to improve nanoelectronics fabrication as Director of the Center for Nanoscale Metrology at CNSE.
