Rigaku - Understanding Semiconductors

"In this episode, IS THERE A DISTINCTION BETWEEN LAB AND FAB IN EARLY INCARNATION OF METROLOGY? HOW TO APPROACH THE FUTURE METROLOGY CHALLENGES? Markus speaks with Professor Alain Diebold, Ph.D. of SUNY Poly regarding: Viewpoints to a Modern and Efficient Approach to Metrology Challenges and Key Takeaways from 2022 Frontiers of Characterization and Metrology for Nanoelectronics Conference."

Listen here.