Research by SUNY Poly Professor James Lloyd published in IEEE
Xplore: "The Lucky Electron Model for TDDB in Low-k Dielectrics"
Published:
Wednesday, January 25, 2017 - 15:04
IEEE Xplore
At the present time, there are at least six models to describe time dependent dielectric breakdown in low-k dielectrics. They all agree with highly accelerated test data quite well and are difficult if not nearly impossible to differentiate experimentally.
